MX-Unique creates tailored atomic force microscope solutions for you: integrating an opto-electro-mechanical coupling detection system to synchronously capture multi-dimensional information at the nanoscale. Let instruments no longer be a shackle restricting innovation, but a key to unlocking unknown fields. You share your vision; we turn it into reality, one by one.
• Atomic Force Microscope for Scattering-type Scanning Near-field Optical Microscopy (s-SNOM) and Nano-Infrared (Nano-IR)
• Atomic Force Microscope Integrated with Raman Spectrometer
• Atomic Force Microscope with In-Situ Mechanical Measurement
• Atomic Force Microscope with External Magnetic Field
• Atomic Force Microscope for High-Vacuum and Low-Temperature Environments
• Atomic Force Microscope Integrated with Metallurgical Microscope
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Rich extended functions
Equipped with proper interface and mounting connection design for convenient and compatible docking with external optical paths, it can be integrated with fluorescence/Raman and spectroscopic detection equipment. A 1300 nm laser source can be configured.
Both hardware and software feature an extremely open architecture, allowing easy expansion of various additional components/functions in a plug-and-play manner. Examples include testing in magnetic fields and liquid environments, testing under high-temperature conditions (with precise temperature control), nano-manipulation, and near-field optical microscopy techniques. All these will help you achieve greater progress in nanotechnology research.
Clear Observation Interface
Equipped with a color CCD for sample alignment and a manual adjustment device for the sample stage position, with a manual adjustment range of 5×5 mm.
| AFM Modes | Contact Mode Tapping Mode Friction Force Microscopy Phase Imaging Mode Force Modulation Mode Magnetic Force Microscopy (MFM) Electrostatic Force Microscopy (EFM) Adhesion Force Imaging Scanning Capacitance Microscopy (SCM) Scanning Kelvin Probe Microscopy (SKPM) Conductive Atomic Force Microscopy (C-AFM) |
| Scanning Range | 30μm x 30μm x 4μm 90μm x 90μm x 9μm（Optional） |
| Resolution | XY≤0.5nm，Z≤0.3nm |
| Noise Level | ≤50pm |
| Nonlinearity | ≤0.1% |
| Sample Stage | Diameter: 100mm Thickness: 20mm Mass: 100g |
| Sample Movement Range | XY≥5mm |
| Optical System | 4X Optical resolution: 2.5 μm Travel range: 5×5 mm Accuracy: ±5 μm |
| Controller | 6 ADC analog-to-digital converters (2 high-speed) 3 DAC digital-to-analog converters (up to 6) 2 independent digital lock-in amplifiers 4-channel simultaneous imaging 6 BNC input/output signal software-configurable interfaces |
