MX-plorer Premium boasts ultra-high resolution.
It features multi-functionality, multi-mode operation and strong practicality, with applications ranging from device characterization to physical chemistry, life sciences, materials science and other fields.
This is an efficient and easy-to-operate instrument.
With reasonable cost, it is widely suitable for cutting-edge scientific research.
Various advanced AFM modes are required, such as Conductive Atomic Force Microscopy (C-AFM), Scanning Kelvin Probe Microscopy (SKPM), etc.
Excellent performance and resolution of closed-loop controlled atomic force microscopy are desired.
The instrument is expected to be cost-effective at a reasonable price.
It is intended for exclusive internal use by an independent research group.
Restricted by policies, imported instruments cannot be purchased; meanwhile, the instrument is required to be comparable to imported equipment in performance.
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Rich extended functions
It is designed with appropriate interfaces and mounting connections for seamless integration with external optical paths, and can be used in combination with fluorescence / Raman and spectroscopic detection equipment. A 1300 nm laser can be configured as the light source.
Both hardware and software feature an extremely open architecture, enabling easy expansion of various additional components and functions in a plug-and-play manner. Examples include measurements in magnetic fields and liquid environments, measurements under high-temperature conditions (with precise temperature control), nanomanipulation, and near-field optical microscopy techniques. All these will help you achieve greater progress in nanotechnology research.
Clear observation interface
Equipped with a color CCD for sample alignment and a manual adjustment device for the sample stage position, with a manual adjustment range of 5×5 mm.
| AFM Modes | Contact Mode Tapping Mode Friction Force Microscopy (FFM) Phase Imaging Mode Force Modulation Mode Magnetic Force Microscopy (MFM) Electrostatic Force Microscopy (EFM) Adhesion Force Imaging Scanning Capacitance Microscopy (SCM) Scanning Kelvin Probe Microscopy (SKPM) Conductive Atomic Force Microscopy (C-AFM) |
| Scanning Range | 30μm x 30μm x 4μm 90μm x 90μm x 9μm（Optional） |
| Resolution | XY≤0.5nm，Z≤0.3nm |
| Noise Level | ≤50pm |
| Nonlinearity | ≤0.1% |
| Sample Stage | Diameter:25mm Thickness:10mm Mass:100g |
| Sample Movement Range | XY≥5mm |
| Optical System | 4X Optical resolution: 2.5 μm Moving range: 5×5 mm Accuracy: ±5 μm |
| Controller | 6 ADC analog-to-digital converters (2 high-speed) 3 DAC digital-to-analog converters (up to 6) 2 independent digital lock-in amplifiers 4-channel simultaneous imaging 6 BNC input/output signal interfaces configurable via software |
