The MX-plorer Basic Atomic Force Microscope provides fundamental AFM functions, making it an ideal choice for entry-level atomic force microscopes.
• Only basic AFM testing functions are required (such as topography imaging, etc.).
• Conduct preliminary selection, screening, testing and evaluation of a large number of samples.
• For exclusive internal use by an independent research group.
• Select the most practical and suitable instrument under the premise of optimal cost.
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Rich extended functions
It features a well-designed interface and connection structure for seamless docking with external optical paths, and can be integrated with fluorescence/Raman and spectroscopic detection systems. A 1300 nm laser can be configured as the light source.
Both its hardware and software feature an extremely open architecture, allowing for easy expansion of various additional components and functions in a plug-and-play manner. Examples include measurements in magnetic fields and liquid environments, tests under high-temperature conditions (with precise temperature control), nanomanipulation, and near-field optical microscopy techniques. All these will help you achieve greater progress in your nanotechnology research.
Clear observation interface
Equipped with a color CCD for sample alignment and a manual adjustment device for the sample stage position, with a manual adjustment range of 5×5 mm.
| AFM Modes | Contact Mode Tapping Mode Friction Force Microscopy Phase Imaging Mode |
| Scanning Range | 30μm x 30μm x 4μm |
| Resolution | XY≤0.5nm，Z≤0.3nm |
| Noise Level | ≤50pm |
| Nonlinearity | ≤0.1% |
| Sample Stage | Diameter: 25mm Thickness:10mm Mass: 100g |
| Sample Movement Range | XY≥5mm |
| Optical System | 4X Optical resolution: 2.5 μm Moving range: 5×5 mm Accuracy: ±5 μm |
| Controller | 6 ADC analog-to-digital converters (2 high-speed) 3 DAC digital-to-analog converters (up to 6) 2 independent digital lock-in amplifiers 4-channel simultaneous imaging 6 BNC input/output signal software-configurable interfaces |
